- scanning Kelvin Probe
- Metallurgy: (сканирующий зонд Келвина) SKP
Универсальный русско-английский словарь. Академик.ру. 2011.
scanning Kelvin Probe
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Kelvin-Sonde — Die Kelvin Sonde (englisch Kelvin probe, KP) findet bei der zerstörungsfreien Messung der Austrittsarbeit und bei der Untersuchung von Delaminierungsprozessen an Polymer , Oxid , und Metall Grenzflächen Verwendung. [1] Die Kombination einer… … Deutsch Wikipedia
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Photoconductive atomic force microscopy — (pc AFM) is a scientific technique.. Multi layer photovoltaic cells have gained popularity since mid 1980s.[1] At the time, research was primarily focused on single layer photovoltaic (PV) devices between two electrodes, in which PV properties… … Wikipedia
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